XRF Glass Panel Sampling Tool For CIGS And CdTe PV Panel Film Composition And Thickness Measurement

Solar Metrology, a global provider of X-Ray Fluorescence (XRF) analysis tools, Expands its SMX XRF tool portfolio for film composition and thickness measurement of CIGS and CdTe photovoltaic depositions with the addition of the FPV, Full panel view, SMX model.

The SMX-FPV is designed for near-line film composition and thickness control of CIGS and CdTe film stacks. The tool has a full 600 by 1200 mm lateral xy range of measurement and is designed for measurement of rigid glass substrates. The FPV provides process control of active, contact and TCO layers. Detailed analysis of full photovoltaic panels is possible including fast and repeatable Copper and Gallium ratio determination as well as panel gradient analysis allows for yield improvement and management and conversion efficiency gains in production.

Solar Metrology's SMX Measurement System provides a production-ready suite of film thickness and composition measurement tools for research and process development, in-process monitoring and post-process quality control.